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TECHNICAL PAPERS

Characterization of Stress at a Ceramic/Metal Joined Interface by the V(z) Technique of Scanning Acoustic Microscopy

[+] Author and Article Information
Chiaki Miyasaka, Bernard R. Tittmann

The Pennsylvania State University, 212 Earth and Engineering Science Building, University Park, PA 16802

Shun-Ichiro Tanaka

The University of Tokyo, Tokyo 153, Japan

J. Pressure Vessel Technol 124(3), 336-342 (Jul 26, 2002) (7 pages) doi:10.1115/1.1480824 History: Received March 22, 2001; Revised March 29, 2002; Online July 26, 2002
Copyright © 2002 by ASME
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References

Tanaka,  S., 1991, “Residual Stresses of Ceramic/Metal Joints,” J. JSTP, 32, No. 369, pp. 1190–1196.
Kobayashi,  H., Arai,  Y., and Nagai,  H., 1991, “Evaluation of Strength of Ceramics/Metal Joints With Defect,” Trans. Jpn. Soc. Mech. Eng., 57, No. 535, pp. 881–884.
Lemons,  R. A., and Quate,  C. F., 1974, “Acoustic Microscope-Scanning Version,” Appl. Phys. Lett., 24, pp. 163–165.
Weglein,  R. D., 1997, “A Model for Predicting Acoustic Materials Signatures,” Appl. Phys. Lett., 34, p. 179–181.
Parmon,  W., and Bertoni,  H. L., 1979, “Ray Interpretation of the Material Signature in the Acoustic Microscope,” Electron. Lett., 15, pp. 684–686.
Atalar,  A., 1978, “An Angular Spectrum Approach to Contrast in Reflection Acoustic Microscopy,” J. Appl. Phys., 49, p. 5130–5139.
Kushibiki,  J., and Chubachi,  N., 1995, “Material Characterization by Line-Focus-Beam Acoustic Microscope,” IEEE Trans., SU-32, pp. 189–212.
Yamanaka,  K., and Enomoto,  Y., 1982, “Observation of Surface Cracks With Scanning Acoustic Microscope,” J. Appl. Phys., 53, pp. 846–850.
Ilett,  C., Somekh,  M. G., and Briggs,  G. A. D., 1984, “Acoustic Microscopy of Elastic Discontinuities,” Proc. R. Soc. London, Ser. A, A393, pp. 171–183.
Briggs,  G. A. D., Jenkins,  P. J., and Hoppe,  M., 1990, “How Fine a Surface Crack Can You See in a Scanning Acoustic Microscope,” J. Microsc., 159, pp. 15–32.
Ohno,  M., Miyasaka,  C., and Tittmann,  B. R., 2001, “Pupil Function Splitting in Calculating Acoustic Microscope Signals for Elastic Discontinuities,” Wave Motion, 33/4, pp. 309–320.

Figures

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Principle of the V(z) curve
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Vsaw reflected from discontinuous interface—(a) SAW incident onto a material having a jointed Interface; (b) SAW reflected from a material having a jointed interface
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(a) and (b) Simulated intensities of specimen; (c) and (d) actual intensities of specimen
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Location of measurement positions for Vsaw and residual stress in Si3N4 across and along jointed interface
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ΔVsaw and residual stress distribution on center line in Si3N4 across the jointed interface
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ΔVsaw and residual stress distribution on y=0.5 mm line in Si3N4 along jointed interface
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Correlation between ΔVsaw and residual stress values in Si3N4
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Measuring points of specimen
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Vsaw distribution frequency: 400 MHz, point focus lens was used—(a) standard specimen; (b) defective specimen
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Micro-defects formed by SEM
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Schematic view of specimen
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Original V(z) curve for Si3N4.Δz is the spacing between the minima. Frequency: 400 MHz, coupling medium: distilled water, temperature: 30°C.

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